70525 ELECTRONIC MEASUREMENT

Year	No.	Offer	Mode	Description			Cred. Pts
97	70525 	S12 	X 	ELECTRONIC MEASUREMENT    	1.00

Contents

STAFFING:

Examiner: D. PARSONS
Moderator: J. BALL
Instructional design: C. COTTMAN

PRE-REQUISITE(S)

70326+70320+70425 or E2004+E2007+70326

SYNOPSIS:


Central  to the profession of all electrical engineering professionals
is  the  measurement  of electrical quantities,  or,  more  generally,
physical  quantities whose values have been rendered electrical  by  a
transducer. Such measurements are almost invariably made with the  aid
of  electronics,  and  increasingly by  sophisticated  instrumentation
which  provides multidimensional displays and analytical capabilities.
Automation  of  such  measurements is  also  on  the  rapid  increase.
However, in the face of these developments the need to comprehend  the
physical  principles  of  making  accurate,  precise  and  trustworthy
measurements,   particularly   of   small   quantities    (microvolts,
microamperes), remains fundamental.

It  is  the task of the engineering professional to be able to specify
and evaluate equipment for a given measurements task; this requires an
appreciation of electronic measurement systems : . at the system level
by  an awareness of the range, operating principles and limitations of
commercial  test equipment; and . at the circuit level which  includes
the   effects  and  minimisation  of  interference,  certain  commonly
employed circuit and IC configurations such as the Phase Lock Loop and
frequency   synthesis,  and  choice  of  components  and  construction
details.

OBJECTIVES:

When a student has successfully completed this unit he/she
should be able to :

  1. Select and operate all common electronic laboratory test
    equipment.
  2. Rapidly acquire skill in the effective use of unfamiliar test
    equipment.
  3. Recognise the limitations of electronic measurement equipment
    by means of a knowledge of their operating principles.
  4. Specify, assemble and program automatic test equipment linked
    via the GPIB.
  5. Know the physical causes and effects of measurement signal
    interference and recommend appropriate minimisation
    techniques.
  6. Know the range of operational, instrumentation and other
    amplifiers available, their errors and limitations and be able
    to select appropriately.
  7. Undertake appropriate "breadboard" construction and testing in
    low signal/high interference environments.
  8. Explain the operation and application of the Phase Lock Loop.
  9. Explain the principles of frequency synthesis.
  10. Explain the principles of reliability theory as applied to
    electronic systems, and undertake calculation, which might
    include composite reliability and subsystem redundancy.

TOPICS:

 Description                                                    Weighting(%)
    

  1. SIGNAL INTERFERENCE AND CORRUPTION                                    10.00
the  problem of measurement, energy flow, input impedance
EMI  and  RFI,  coupling paths, screening,  guarding  and
grounding, EMC

    

  2. ELECTRONIC MEASUREMENT COMPONENTS AND CIRCUITS                        25.00
operational  amplifiers and their errors; instrumentation
and isolation amplifiers; selection, ICs and modules; the
Phase   Lock   Loop;   frequency  synthesis   principles;
modulation and frequency shifting

    

  3. ELECTRONIC TEST EQUIPMENT                                             40.00
analogue and digital voltmeters, current, power, gain and
phase  measurement;  frequency  and  period  measurement;
standards  and  calibration;  the  oscilloscope  and  CRT
display;   signal   sources;  analogue   swept   spectrum
measurements;  the  digital  oscilloscope   and   sampled
measurement   systems;   quantisation,   aliassing    and
interpolation  problems;  test  equipment   for   digital
systems; the logic analyser

    

  4. AUTOMATIC TEST EQUIPMENT                                              15.00
the GPIB, operation, use and programming; internal design
of GPIB-based test equipment

    

  5. ELECTRONIC RELIABILITY                                                10.00
component  reliability, burn in, wear out  and  derating;
MTBF;  composite  reliability and system MTBF;  subsystem
redundancy;   high  reliability  systems;   concepts   of
hybridisation and microelectronics.

TEXT and MATERIALS to be PURCHASED:

Electronic component as specified in study materials.

RECOMMENDED REFERENCE MATERIALS:

Tran Tien Lang, "Electronics of Measuring Systems", John Wiley,
1987.

Millman J and Grabel A, "Microelectronics", 2nd Edition, McGraw
Hill, 1988.

Sheingold D H, ed, "Transducer Interfacing Handbook", Analog Devices
Inc, 1980.

Morrison R, "Grounding and Shielding Techniques in Instrumentation",
3rd Edition, Wiley, 1983.

Denny H W, "Grounding for the Control of EMI", Don White Consultants
Inc, 1983.

Ott H W, "Noise Reduction Techniques in Electronic Systems", Wiley,
1976.

Analog Devices Data Book.

Helfrick A D and Cooper W D, "Modern Electronic Instrumentation and
Measurement Techniques", Prentice Hall, 1990.

Ibrahim K F, "Instruments and Automatic Test Equipment", Longman,
1988.

Drummer G H A and Griffin N B, "Electronics Reliability - Calculation
and Design", Pergamon, 1966.

Buchla D and McLachlan W, "Applied Electronic Instrumentation and
Measurement", Macmillan, 1992.

STUDENT WORKLOAD REQUIREMENTS:

	ACTIVITY				HOURS
Project Work                                  	48
Report Writing                                	20
Residential School                            	24
Directed Study                                	50
Private Study                                 	30
Examinations                                  	3

ASSESSMENT DETAILS:

No  *F/S Marks     Due        Description                              Wtg(%)    LBL
1   F              25/02/97  REQUEST FOR EXEMPTION                               Y
2   F              24/03/97  CML 1                                               Y
3   S              16/05/97  HOME EXPERIMENT 1 - INSTRUM AMP           15.00     Y
4   S              26/05/97  HOME EXPERIMENT 2 - PHASE LOCK LOOP       5.00      Y
5   F              02/06/97  CML 2                                               Y
6   S              06/10/97  RESIDENTIAL SCHOOL 1 - TEST EQPMT REPO    5.00      Y
7   S              06/10/97  RESIDENTIAL SCHOOL 2 - ATE DEMO           5.00      Y
8   F              17/10/97  CML 3                                               Y
9   S              27/10/97  RESIDENTIAL SCHOOL 2 - ATE REPORT         10.00     Y
10  S              END S2    3 HOUR CLOSED BOOK EXAMINATION            60.00     N

*F=Formative, S=Summative

OTHER REQUIREMENTS:

1    Attendance at BOTH parts of the residential school in  this  unit
     is compulsory. Both are held in the same week in September.
2    Exemption  from Residential School 1 - Test Equipment (Assessment
     6) will be granted to those students who have achieved a grade of
     B   or   higher  in  unit  77209  Electronics  III  in  1991   or
     subsequently.
3    To  pass the unit, at least 45% must be achieved in each  of  the
     six summative assessments.
4    The penalty for late submission of any assessment will be 10% per
     week unless specifically negotiated with the Examiner.
5    An aggregate mark of at least 50% is required to pass the unit.
6    The   Faculty  of  Engineering  and  Surveying  will  NOT  accept
     submission  of  hand written or typed assignments  by  facsimile,
     email  or computer diskette. Students in remote locations who  do
     not  have regular access to postal services may be given  special
     consideration.
7    A  minimum  standard of communication skills must be demonstrated
     in order for a passing grade to be achieved.
This information is accurate as at 28/11/97